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  1. We show in random matrix theory, microwave measurements, and computer simulations that the mean free ‎path of a random medium and the strength and position of an embedded reflector can be determined from ‎radiation scattered by the system. The mean free path and strength of the reflector are determined from the ‎statistics of transmission. The statistics of transmission are independent of the position of the reflector. The ‎reflector's position can be found, however, from the average dwell time for waves incident from one side of ‎the sample.‎ 
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